Comment on long run trends in patents

Schankerman, MarkORCID logo (1987) Comment on long run trends in patents. In: R&d, Patents and Productivity. University of Chicago Press, Chicago, IL., USA. ISBN 978-0226308845
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Item Type Chapter
Departments Economics
STICERD
Date Deposited 23 May 2008 15:18
URI https://researchonline.lse.ac.uk/id/eprint/5056

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